{"id":271,"date":"2009-11-28T20:05:10","date_gmt":"2009-11-28T19:05:10","guid":{"rendered":"http:\/\/localhost:8888\/tsrceu\/sem\/"},"modified":"2020-09-04T16:59:14","modified_gmt":"2020-09-04T14:59:14","slug":"scanning-electron-microscope-fe-sem","status":"publish","type":"post","link":"https:\/\/tsrc.eu\/en\/scanning-electron-microscope-fe-sem\/","title":{"rendered":"Scanning Electron Microscope (FE SEM)"},"content":{"rendered":"

\n\n\n\n\n\n\n\n\n\n\n
\n

Name of equipment:<\/strong><\/p>\n<\/td>\n

\n

Scanning Electron Microscope (FE SEM)<\/span><\/strong><\/p>\n<\/td>\n<\/tr>\n

\n

Use:<\/strong><\/p>\n<\/td>\n

\n

SEM allows researching the structures invisible to human eye by magnification up to 1,000,000 times.<\/p>\n<\/td>\n<\/tr>\n

\n

Model, type, country of origin:<\/strong><\/p>\n<\/td>\n

MIRALMU, Tescan, Czech<\/td>\n<\/tr>\n
\n

\n

\n

Technical characte-ristics:<\/strong><\/p>\n<\/td>\n

Resolution: 1.0 – 3.0 nm<\/p>\n

Magnification: 4 x – 1.000.000 x<\/p>\n

Electron gun: high brithness Schottky emitter<\/p>\n

Scanning features: Dynamic Focus, Point & Line Scan, 3D Beam<\/p>\n

Microscope control: PC controlled by the program MiraTC, using the WindowsTM<\/sup> platform<\/p>\n

Automatic procedures: In-Flight Beam TracingTM<\/sup>, EasySEMTM<\/sup>, Wide Field OpticsTM<\/sup><\/td>\n<\/tr>\n

Year of origin:\u00a0 2009.\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 <\/strong><\/p>\n

Figure: <\/strong><\/p>\n

<\/p>\n<\/td>\n<\/tr>\n

\n

\n

Method of
\nwork:<\/strong><\/p>\n<\/td>\n

Carefully prepared sample is placed in the chamber. Tightly focused electron beam falls on the surface of the sample from which high energy electrons are reflected and recorded by detectors. They simultaneously amplify the signal displayed as variations of brightness in the cathode ray tube.<\/td>\n<\/tr>\n
\n

Department,
\nroom, location:<\/strong><\/p>\n<\/td>\n

Department for Textile Chemistry and Ecology,<\/p>\n

SEM Laboratory,<\/p>\n

Savska cesta 16\/9<\/td>\n<\/tr>\n

Addition note:<\/strong><\/p>\n

\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0\u00a0 \u00a0 \/ <\/strong><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Name of equipment: Scanning Electron Microscope (FE SEM) Use: SEM allows researching the structures invisible to human eye by magnification up to 1,000,000 times. Model,…<\/p>\n","protected":false},"author":1,"featured_media":270,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[8],"tags":[],"class_list":["post-271","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-other"],"acf":[],"_links":{"self":[{"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/posts\/271","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/comments?post=271"}],"version-history":[{"count":4,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/posts\/271\/revisions"}],"predecessor-version":[{"id":3931,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/posts\/271\/revisions\/3931"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/media\/270"}],"wp:attachment":[{"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/media?parent=271"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/categories?post=271"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/tsrc.eu\/en\/wp-json\/wp\/v2\/tags?post=271"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}